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Correlation between the structural and optical properties of spontaneously formed GaN nanowires: a quantitative evaluation of the impact of nanowire coalescence

机译:结构与光学性质的相关性   自发形成的GaN纳米线:对影响的定量评估   纳米线聚结

摘要

We investigate the structural and optical properties of spontaneously formedGaN nanowires with different degrees of coalescence. This quantity isdetermined by an analysis of the cross-sectional area and perimeter of thenanowires obtained by plan-view scanning electron microscopy. X-ray diffractionexperiments are used to measure the inhomogeneous strain in the nanowireensembles as well as the orientational distribution of the nanowires. Thecomparison of the results obtained for GaN nanowire ensembles prepared on bareSi(111) and AlN buffered 6H-SiC(000-1) reveals that the main source of theinhomogeneous strain is the random distortions caused by the coalescence ofadjacent nanowires. The magnitude of the strain inhomogeneity induced bynanowire coalescence is found not to be determined solely by the coalescencedegree, but also by the mutual misorientation of the coalesced nanowires. Thelinewidth of the donor-bound exciton transition in photoluminescence spectradoes not exhibit a monotonic increase with the coalescence degree. In contrast,the comparison of the root mean square strain with the linewidth of thedonor-bound exciton transition reveals a clear correlation: the higher thestrain inhomogeneity, the larger the linewidth.
机译:我们研究具有不同聚结程度的自发形成的GaN纳米线的结构和光学性质。该量通过分析由平面扫描电子显微镜获得的纳米线的横截面积和周长来确定。 X射线衍射实验用于测量纳米线集合体中的不均匀应变以及纳米线的取向分布。在裸露的Si(111)和AlN缓冲的6H-SiC(000-1)上制备的GaN纳米线集成体的结果比较表明,不均匀应变的主要来源是相邻纳米线的聚结引起的随机变形。发现由纳米线聚结引起的应变不均匀性的大小不仅取决于聚结度,而且还取决于聚结的纳米线的相互错位。在光致发光光谱中,供体结合的激子跃迁的线宽不会随聚结度而单调增加。相反,均方根应变与供体结合的激子跃迁的线宽的比较显示出明显的相关性:应变不均匀性越高,线宽越大。

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